DLTS characterization of aluminum gettering of iron contaminants in boron-doped silicon
Name
36228790-MIT.pdf
Description
Full printable version
Size
1.4 MB
Format
Adobe PDF
Checksum (MD5)
8a8e2047c34ee5754012c50095ba6c39
Author(s)
Thienprasit, Jeanne A. (Jeanne Athya)
Advisor(s)
David K. Roylance.
Alternative Title
Deep level transient spectrosopy of aluminum gettering of iron contaminants in boron-doped silicon.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (B.S.)--Massachusetts Institute of Technology, Dept. of Physics, 1996.
Includes bibliographical references.
Subjects
Physics
MIT Department
Massachusetts Institute of Technology. Department of Physics
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
