Migration and effects of copper in p-type bismuth telluride
Name
RLE-TR-376-04740976.pdf
Size
2.15 MB
Format
Adobe PDF
Checksum (MD5)
f0fbd8e9cc13a39c85a40a615387bac2
Date Issued
1960
Publisher
Massachusetts Institute of Technology, Research Laboratory of Electronics
Series/Report no.
Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 376.
Description
"September 1, 1960." Based partly on a thesis submitted to the M.I.T. Dept. of Electrical Engineering, June, 1960.
Bibliography: p. 35.
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
Persistent DSpace Link