Migration and effects of copper in p-type bismuth telluride

Name

RLE-TR-376-04740976.pdf

Size

2.15 MB

Format

Adobe PDF

Checksum (MD5)

f0fbd8e9cc13a39c85a40a615387bac2

Date Issued

1960

Publisher

Massachusetts Institute of Technology, Research Laboratory of Electronics

Series/Report no.

Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 376.

Description

"September 1, 1960." Based partly on a thesis submitted to the M.I.T. Dept. of Electrical Engineering, June, 1960.

Bibliography: p. 35.

MIT Department

Massachusetts Institute of Technology. Research Laboratory of Electronics

Persistent DSpace Link