Microscope-Integrated Intraoperative Ultrahigh-Speed Swept-Source Optical Coherence Tomography for Widefield Retinal and Anterior Segment Imaging
Name
nihms-1006167.pdf
Description
Accepted version
Size
1.62 MB
Format
Adobe PDF
Checksum (MD5)
2d63f5c15eb48377f51cf71759c739de
Author(s)
Lu, Chen David
Waheed, Nadia K.
Witkin, Andre
Baumal, Caroline R.
Liu, Jonathan J.
Potsaid, Benjamin M.
Joseph, Anthony
Jayaraman, Vijaysekhar
Cable, Alex
Chan, Kinpui
Date Issued
February 2018
Journal
Opthalmic Surgery, Lasers and Imaging Retina
Publisher
Healio
Citation
Lu, Chen D. et al. "Microscope-Integrated Intraoperative Ultrahigh-Speed Swept-Source Optical Coherence Tomography for Widefield Retinal and Anterior Segment Imaging." Opthalmic Surgery, Lasers and Imaging Retina 49, 2 (February 2018): 94-102 © 2018 Healio
Version
Author's final manuscript
Abstract
BACKGROUND AND OBJECTIVE: To demonstrate the feasibility of retinal and anterior segment intraoperative widefield imaging using an ultrahigh-speed, swept-source optical coherence tomography (SS-OCT) surgical microscope attachment. PATIENTS AND METHODS: A prototype post-objective SS-OCT using a 1,050-nm wavelength, 400 kHz A-scan rate, vertical cavity surface-emitting laser (VCSEL) light source was integrated to a commercial ophthalmic surgical microscope after the objective. Each widefield OCT data set was acquired in 3 seconds (1,000 × 1,000 A-scans, 12 × 12 mm² for retina and 10 × 10 mm² for anterior segment). RESULTS: Intraoperative SS-OCT was performed in 20 eyes of 20 patients. In six of seven membrane peels and five of seven rhegmatogenous retinal detachment repair surgeries, widefield retinal imaging enabled evaluation pre- and post-operatively. In all seven cataract cases, anterior imaging evaluated the integrity of the posterior lens capsule. CONCLUSIONS: Ultrahigh-speed SS-OCT enables widefield intraoperative viewing in the posterior and anterior eye. Widefield imaging visualizes ocular structures and pathology without requiring OCT realignment.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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DOI of Published Version
https://doi.org/10.3928/23258160-20180129-03
