Testing for time-dependent failures in electronic products
Name
31673724-MIT.pdf
Description
Full printable version
Size
7.91 MB
Format
Adobe PDF
Checksum (MD5)
158d80de9270892ed897cc1f10100c74
Author(s)
Peterson, Michael L. (Michael Laurel)
Date Issued
1994
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994.
Includes bibliographical references (p. 94-95).
Subjects
Sloan School of Management
Electrical Engineering
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering
Sloan School of Management
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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