Tip steering of the Atomic Force Microscope.
Name
78613459-MIT.pdf
Description
Full printable version
Size
2.81 MB
Format
Adobe PDF
Checksum (MD5)
fa369bab7698a2dabcda88ec4fa633ef
Author(s)
Kesner, Samuel B. (Samuel Benjamin)
Advisor(s)
Kamal Youcef-Toumi.
Alternative Title
Tip steering of the AFM
Date Issued
2006
Publisher
Massachusetts Institute of Technology
Abstract
The Atomic Force Microscope (AFM) is a powerful tool for the imaging of extremely small objects on the scale of nanometers, like carbon nanotubes and strands of DNA. There currently is a need for methods to actively steer the probe tip of the AFM in order to greatly reduce the time required to image certain samples. This paper proposes a tip steering method that utilizes the vertical feedback information from the AFM sensor as well as the dimensions of the sample object to determine and maintain a scanning trajectory. A comparison of similar trajectory tracking methods is also presented. The AFM system and operation is discussed in order to justify the tip steering method. Finally, the method proposed is successfully simulated with a DNA strand sample in the presence of measurement noise.
Description
Thesis (S.B.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2006.
Includes bibliographical references (p. 58-59).
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
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