Design and control optimization for high-speed jumping mode Atomic Force Microscope
Name
1005081345-MIT.pdf
Description
Full printable version
Size
12.93 MB
Format
Adobe PDF
Checksum (MD5)
3b6cdc10c9c5236c8c8657726093da6e
Author(s)
Xia, Fangzhou
Advisor(s)
Kamal Youcef-Toumi.
Date Issued
2017
Publisher
Massachusetts Institute of Technology
Abstract
In this thesis, I improved the design of a high-speed Atomic Force Microscope (AFM) for jumping mode operation. The relations between important imaging parameters and physical limitations of the system were established first to identify the aspects of improvement. Two control algorithms to improve the imaging speed and probe sample interaction force for jumping mode atomic force microscopy operation have been proposed and investigated both in simulation and experiment. A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation.
Description
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2017.
Cataloged from PDF version of thesis.
Includes bibliographical references (pages 107-111).
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
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