Load deflection analysis for determining mechanical properties of thin films with tensile and compressive residual stresses
Name
33960838-MIT.pdf
Description
Full printable version
Size
2.08 MB
Format
Adobe PDF
Checksum (MD5)
338bf4b48cbf23ef89a14de224e2529c
Author(s)
Bulsara, Mayank T. (Mayank Thakordas)
Advisor(s)
Stuart B. Brown.
Date Issued
1995
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.
Includes bibliographical references (leaves 24-25).
Subjects
Materials Science and Engineering
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
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