Understanding aging in chalcogenide glass thin films using precision resonant cavity refractometry
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ome-9-5-2252.pdf
Description
Published version
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2.51 MB
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Checksum (MD5)
8c527469d6c97e56cc64315a29b36711
Author(s) • • • • • • • • •
Geiger, Sarah J.
Du, Qingyang
Huang, Bin
Shalaginov, Mikhail
Michon, Jerome
Lin, Hongtao
Gu, Tian
Yadav, Anupama
Richardson, Kathleen A.
Jia, Xinqiao
Date Issued
April 2019
Journal
Optical Materials Express
Publisher
Optical Society of America (OSA)
Citation
Geiger, Sarah et al. "Understanding aging in chalcogenide glass thin films using precision resonant cavity refractometry." Optical Materials Express 9, 5 (April 2019): 2252-2263 © 2019 Optical Society of America
Version
Final published version
Abstract
Chalcogenide glass (ChG) thin films have a wide range of applications in planar photonics that rely on the stability of their optical properties. However, most methods do not provide quantitative optical property data at sufficiently high resolution. We have employed a resonant cavity refractometry technique capable of detecting refractive index changes down to 10[superscript -6] refractive index unit (RIU) to study the aging, or sub-T[subscript g] structural relaxation kinetics, of Ge[subscript 23]Sb[subscript 7]S[subscript 70]ChG. Our study reveals that the refractive index (RI) change due to aging tends to follow stretched exponential behavior, with stretch exponents and rate of index change dependent on initial glass treatment. Thermally annealed devices show the best stability, suggesting that thermal annealing is the appropriate post-deposition treatment method for obtaining stable ChG films.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Materials Research Laboratory
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DOI of Published Version
http://dx.doi.org/10.1364/ome.9.002252