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  4. Exciton trapping is responsible for the long apparent lifetime in acid-treated

Exciton trapping is responsible for the long apparent lifetime in acid-treated

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Author(s)
Goodman, Aaron Jacob
•
Willard, Adam P.
•
Tisdale, William
Date Issued
September 2017
Journal
Physical Review B
Publisher
American Physical Society
Citation
Goodman, A. J. et al. "Exciton trapping is responsible for the long apparent lifetime in acid-treated." Physical Review B 96, 12 (September 2017): 121404(R) © 2017 American Physical Society
Version
Final published version
Abstract
Here, we show that deep trapped “dark” exciton states are responsible for the surprisingly long lifetime of band-edge photoluminescence in acid-treated single-layer MoS₂. Temperature-dependent transient photoluminescence spectroscopy reveals an exponential tail of long-lived states extending hundreds of meV into the band gap. These subband states, which are characterized by a 4 μs radiative lifetime, quickly capture and store photogenerated excitons before subsequent thermalization up to the band edge where fast radiative recombination occurs. By intentionally saturating these trap states, we are able to measure the “true” 150 ps radiative lifetime of the band-edge exciton at 77 K, which extrapolates to ∼600 ps at room temperature. These experiments reveal the dominant role of dark exciton states in acid-treated MoS₂, and suggest that excitons spend >95% of their lifetime at room temperature in trap states below the band edge. We hypothesize that these states are associated with native structural defects, which are not introduced by the superacid treatment; rather, the superacid treatment dramatically reduces nonradiative recombination through these states, extending the exciton lifetime and increasing the likelihood of eventual radiative recombination.
MIT Department
Massachusetts Institute of Technology. Department of Chemical Engineering
Massachusetts Institute of Technology. Department of Chemistry
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/114549
DOI of Published Version
https://doi.org/10.1103/PhysRevB.96.121404
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