Polarimetry with a soft x-ray spectrometer
Name
Marshall-2009-Polarimetry with a soft X-ray spectrometer.pdf
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607.53 KB
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Checksum (MD5)
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Author(s)
Marshall, Herman
Date Issued
July 2008
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
Society of Photo-optical Instrumentation Engineers
Citation
Marshall, Herman L. “Polarimetry with a soft x-ray spectrometer.” Space Telescopes and Instrumentation 2008: Ultraviolet to Gamma Ray. Ed. Martin J. L. Turner & Kathryn A. Flanagan. Marseille, France: SPIE, 2008. 701129-8. © 2008 SPIE
Version
Final published version
Abstract
An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation as a function of energy and position angle is measured to determine three Stokes parameters: I, Q, and U. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors over 80% over the entire 0.2 to 0.8 keV band. A sample design is shown that could be used with a small orbiting mission.
MIT Department
MIT Kavli Institute for Astrophysics and Space Research
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
http://dx.doi.org/10.1117/12.787249
