TID Tolerance of Popular CubeSat Components
Name
Cahoy_TID Tolerance.pdf
Size
137.49 KB
Format
Adobe PDF
Checksum (MD5)
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Author(s)
Schmidt, Frank Hall
Cahoy, Kerri
Sklair, Devon A.
Blackwell, William J.
Osarentin, I.
Legge Jr, Robert S.
Kingsbury, Ryan W
Date Issued
July 2013
Journal
Proceedings of the 50th Nuclear and Space Radiation Effects Conference 2013
Citation
R. Kingsbury, F. Schmidt, K. Cahoy, D. Sklair. "TID Tolerance of Popular CubeSat Components" 50th Nuclear and Space Radiation Effects Conference 2013.
Version
Author's final manuscript
Abstract
In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, a popular microcontroller (PIC24) as well as SD memory cards
MIT Department
Lincoln Laboratory
Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Massachusetts Institute of Technology. Space Systems Laboratory
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike 3.0
Persistent DSpace Link
DOI of Published Version
http://www.nsrec.com/brochure2013.pdf
