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Environment-assisted metrology with spin qubits

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Author(s)
Cappellaro, Paola
•
Hodges, Jonathan S.
•
Goldstein, Garry
•
Jiang, Liang
•
Maze, Jeronimo R.
•
Sørensen, A. S.
•
Lukin, Mikhail D.
Date Issued
March 2012
Journal
Physical Review A
Publisher
American Physical Society
Citation
Cappellaro, P. et al. “Environment-assisted Metrology with Spin Qubits.” Physical Review A 85.3 (2012): 032336. Copyright 2012 American Physical Society.
Version
Final published version
Abstract
We investigate the sensitivity of a recently proposed method for precision measurement [ Phys. Rev. Lett. 106 140502 (2011)], focusing on an implementation based on solid-state spin systems. The scheme amplifies a quantum sensor response to weak external fields by exploiting its coupling to spin impurities in the environment. We analyze the limits to the sensitivity due to decoherence and propose dynamical decoupling schemes to increase the spin coherence time. The sensitivity is also limited by the environment spin polarization; therefore, we discuss strategies to polarize the environment spins and present a method to extend the scheme to the case of zero polarization. The coherence time and polarization determine a figure of merit for the environment's ability to enhance the sensitivity compared to echo-based sensing schemes. This figure of merit can be used to engineer optimized samples for high-sensitivity nanoscale magnetic sensing, such as diamond nanocrystals with controlled impurity density.
MIT Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/72570
DOI of Published Version
https://doi.org/10.1103/PhysRevA.85.032336
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