Defect characterization of erbium doped silicon light emitting diodes

Gupta, Rita, 1970-

Defect characterization of erbium doped silicon light emitting diodes

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Author(s)

Gupta, Rita, 1970-

Advisor(s)

Lionel C. Kimerling.

Date Issued

1994

Publisher

Massachusetts Institute of Technology

Description

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1994.

Includes bibliographical references (leaves 86-88).

Subjects

Materials Science and Engineering

MIT Department

Massachusetts Institute of Technology. Department of Materials Science and Engineering

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