General expression for effective diffusivity of foreign atoms migrating via a fast intermediate
Name
Braatz_General expression.pdf
Size
81.37 KB
Format
Adobe PDF
Checksum (MD5)
1bdb3c8183749e6eb65e573bf74b1267
Author(s)
Chen, Kejia
Vaidyanathan, Ramakrishnan
Seebauer, Edmund G.
Braatz, Richard D.
Date Issued
January 2010
Journal
Journal of Applied Physics
Publisher
American Institute of Physics (AIP)
Citation
Chen, Kejia et al. “General Expression for Effective Diffusivity of Foreign Atoms Migrating via a Fast Intermediate.” Journal of Applied Physics 107.2 (2010): 026101. ©2010 American Institute of Physics
Version
Final published version
Abstract
In many solids, diffusion of foreign atoms takes place primarily through highly mobile intermediate species that periodically exchange with atoms in the crystalline lattice. The governing reaction-diffusion equations include a diffusion coefficient as well as kinetic parameters describing the exchange of the intermediate species. Yet it is often convenient to model a diffusive process in terms of a single parameter, no matter what the time regime. This communication derives for a delta function initial profile an exact expression for the effective diffusivity that is valid in all time regimes. In the case of semiconductor solids, such an expression can be helpful in the interpretation of dopant diffusion measurements.
MIT Department
Massachusetts Institute of Technology. Department of Chemical Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1063/1.3294479
