Analysis of hot-carrier AC lifetime model for MOSFET
Name
35334248-MIT.pdf
Description
Full printable version
Size
2.94 MB
Format
Adobe PDF
Checksum (MD5)
daac6043e99cb9327d4501d98704874a
Author(s)
Menberu, Beniyam
Advisor(s)
James Chung.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
Includes bibliographical references (leaf 81).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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