Multiscale hypothesis testing with application to anomaly characterization from tomographic projections
Name
35968351-MIT.pdf
Description
Full printable version
Size
11.11 MB
Format
Adobe PDF
Checksum (MD5)
325dbea2ad086bdf2bf790f75a396a2a
Author(s)
Frakt, Austin B. (Austin Berk)
Advisor(s)
Alan S. Willsky, W. Clem Karl.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
Includes bibliographical references (p. 151-155).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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