Metrics for measuring the value of computer integrated manufacturing (CIM) systems
Name
31449395-MIT.pdf
Description
Full printable version
Size
10.61 MB
Format
Adobe PDF
Checksum (MD5)
685a4e7e199efe745eb300cb788787ed
Author(s)
Crandall, William W
Advisor(s)
John V. Guttag, Michael A. Cusumano.
Date Issued
1994
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1994, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering, 1994
Includes bibliographical references (leaves 129-136).
Subjects
Sloan School of Management
Electrical Engineering
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering
Sloan School of Management
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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