The effects of grain structure and Cu distribution on the relability of near-bamboo Al-Cu alloy interconnects
Name
37525747-MIT.pdf
Description
Full printable version
Size
14.45 MB
Format
Adobe PDF
Checksum (MD5)
8e18540989cc444db2fea0869281ba63
Author(s)
Knowlton, Brett D. (Brett Douglas)
Advisor(s)
Carl V. Thompson.
Date Issued
1997
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1997.
Includes bibliographical references (leaves 297-289).
Subjects
Materials Science and Engineering
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
