An interoperable internet scale solution for RFID network security
Name
Mao-2009-An interoperable internet scale solution for RFID network security.pdf
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283.55 KB
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Adobe PDF
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Author(s)
Mao, Tingting
Sanchez, Abel
Williams, John R
Date Issued
September 2009
Journal
Proceedings of 18th Internatonal Conference on Computer Communications and Networks, 2009. ICCCN 2009.
Publisher
Institute of Electrical and Electronics Engineers
Citation
Tingting Mao, J.R. Williams, and A. Sanchez. “An Interoperable Internet Scale Solution for RFID Network Security.” Computer Communications and Networks, 2009. ICCCN 2009. Proceedings of 18th Internatonal Conference on. 2009. 1-6. © Copyright 2010 IEEE
Version
Final published version
Abstract
Security and privacy issues are critically important in RFID networks because EPC data and their associated business events are valuable assets. In this paper, an Interoperable Internet-Scale Security (IISS) framework for RFID networks is proposed. The IISS framework performs authentication and authorization based on an aggregation of business rules, enterprise information, and RFID tag information. IISS provides a protocol for several authentication schemes and identity techniques. It also provides an engine for reasoning over business rules from different domains. Moreover, the IISS framework is able to resolve provenance information of RFID tags, which can identify the history of a particular piece of EPC data through the supply chain. The IISS framework and the IISS ontologies to model the information in RFID networks are also described, and how the IISS framework can be developed for access control in RFID enabled supply chains is discussed. Finally, the IISS framework's efficiency is tested using a supply chain EPC simulator as the testing platform, which allows optimization of the IISS protocol's performance.
MIT Department
Massachusetts Institute of Technology. Auto-ID Laboratory
Massachusetts Institute of Technology. Department of Civil and Environmental Engineering
Massachusetts Institute of Technology. Laboratory for Manufacturing and Productivity
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1109/ICCCN.2009.5235214
