Modeling quantum noise for efficient testing of fault-tolerant circuits
Name
Magesan-2013-Modeling quantum noise for efficient testing of fault-tolerant circuits.pdf
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Author(s)
Magesan, Easwar
Puzzuoli, Daniel
Granade, Christopher E.
Cory, David G.
Date Issued
January 2013
Journal
Physical Review A
Publisher
American Physical Society
Citation
Magesan, Easwar et al. “Modeling Quantum Noise for Efficient Testing of Fault-tolerant Circuits.” Physical Review A 87.1 (2013). ©2013 American Physical Society
Version
Final published version
Abstract
Understanding fault-tolerant properties of quantum circuits is important for designing large-scale quantum information processors. In particular, simulating properties of encoded circuits is a crucial tool for investigating the relationship between properties such as the noise model, encoding scheme, and threshold value. For general noisy circuits, these simulations quickly become intractable in the size of the encoded circuit. We introduce a general theoretical method for approximating a noise process by one that allows for efficient Monte Carlo simulation of properties of encoded circuits. The approximation is as close to the original process as possible without overestimating its ability to preserve quantum information, a key property for obtaining honest estimates of threshold values. We numerically illustrate the method with various physically relevant noise models.
MIT Department
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1103/PhysRevA.87.012324
