Three-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films
Name
895868016-MIT.pdf
Description
Full printable version
Size
9.7 MB
Format
Adobe PDF
Checksum (MD5)
483c5b76c9bc2f37defa920f91aabbe9
Author(s)
Youssef, Amanda
Advisor(s)
Tonio Buonassisi.
Alternative Title
3-dimensional defect characterization : focused ion beam tomography applied to tin sulfide thin films
3D defect characterization : focused ion beam tomography applied to tin sulfide thin films
Date Issued
2014
Publisher
Massachusetts Institute of Technology
Abstract
Porosity is postulated to be one of the reasons for the low efficiency of tin sulfide-based devices. This work is a preliminary investigation of the effects of two film growth parameters deposition rate and substrate temperature - on porosity. We employ the focused ion beam tomography technique to characterize and quantify porosity in tin sulfide thin films. We then generate 3D reconstructions of pores inside milled volumes from the films and quantify pore volumes. To explain the results, we employ nucleation theory and develop two different models: (a) a thermodynamic model that assumes pores form primarily from an effect known as "self-shadowing," whereby growth-rate anisotropy results in some grains that grow faster than their neighbors, and (b) a kinetic model that assumes a diffusion-driven process of void formation. We show that both models qualitatively support the experimental results, providing insight into process-structure relations that may improve film quality during growth.
Description
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2014.
Cataloged from PDF version of thesis.
Includes bibliographical references (pages 81-86).
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
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