Reliability in layered networks with random link failures
Name
Modiano-2010-Reliability in Layered Networks with Random.pdf
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320.7 KB
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Author(s)
Lee, Kayi
Lee, Hyang-Won
Modiano, Eytan H.
Date Issued
March 2010
Journal
IEEE INFOCOM proceedings 2010
Publisher
Institute of Electrical and Electronics Engineers
Citation
Lee, Kayi, Hyang-Won Lee, and Eytan Modiano. “Reliability in Layered Networks with Random Link Failures.” IEEE INFOCOM, 2010. 1-9. Web. 29 Sept. 2011.
Version
Final published version
Abstract
We consider network reliability in layered networks where the lower layer experiences random link failures. In layered networks, each failure at the lower layer may lead to multiple failures at the upper layer. We generalize the classical polynomial expression for network reliability to the multi-layer setting. Using random sampling techniques, we develop polynomial time approximation algorithms for the failure polynomial. Our approach gives an approximate expression for reliability as a function of the link failure probability, eliminating the need to resample for different values of the failure probability. Furthermore, it gives insight on how the routings of the logical topology on the physical topology impact network reliability. We show that maximizing the min cut of the (layered) network maximizes reliability in the low failure probability regime. Based on this observation, we develop algorithms for routing the logical topology to maximize reliability.
MIT Department
Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1109/INFCOM.2010.5461985
