Automated transient grating spectroscopy mapping and signal control for large samples
Name
074902_1_5.0202262.pdf
Description
Published version
Size
8.33 MB
Format
Adobe PDF
Checksum (MD5)
1640fee85db44b2c3043cc8ddacb57f2
Author(s)
Weaver, Colin
Stapelberg, Myles
Short, Michael P
Wylie, Angus
Artalejo, Elena Botica
Date Issued
July 10, 2024
Journal
Review of Scientific Instruments
Publisher
AIP Publishing
Citation
Colin Weaver, Myles Stapelberg, Michael P. Short, Angus Wylie, Elena Botica Artalejo; Automated transient grating spectroscopy mapping and signal control for large samples. Rev. Sci. Instrum. 1 July 2024; 95 (7): 074902.
Version
Final published version
Abstract
We present developments for the mapping of large areas using transient grating spectroscopy (TGS) that allow for smoother, larger, autonomous measurements of material samples. The addition of a precise linear stage in the direction parallel to laser sampling coupled with signal optimizing control allows for hands free, self-correcting measurements. In addition, the simplification of the sample holding design to a form that is small enough to mount directly to the linear stage exhibits a straightforward, low-cost solution for automated TGS applications. This capability is demonstrated by taking large uninterrupted maps of gradient wafers, and the results are validated on calibrated tungsten samples and control TGS samples from gradient wafers.
MIT Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Terms of Use
Creative Commons Attribution
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1063/5.0202262
