Packaging and qualification of single photon counting avalanche photodiode focal plane arrays
Name
Funk-2009-Packaging and qualification of single photon counting avalanche photodiode focal plane arrays.pdf
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1014.3 KB
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Author(s)
Verghese, Simon
Ruff, Albert C.
Brattain, Michael A.
McIntosh, K. Alexander
Smith, Gary M.
Funk, Joseph E.
Date Issued
April 2009
Journal
Proceedings of SPIE
Publisher
The International Society for Optical Engineering
Citation
Funk, Joseph E. et al. “Packaging and qualification of single-photon counting avalanche photodiode focal plane arrays.” Advanced Photon Counting Techniques III. Ed. Mark A. Itzler & Joe C. Campbell. Orlando, FL, USA: SPIE, 2009. 73200S-9. © 2009 SPIE--The International Society for Optical Engineering
Version
Final published version
Abstract
Avalanche Photodiode (APD) photon counting arrays are finding an increasing role in defense applications in laser radar and optical communications. As these system concepts mature, the need for reliable screening, test, assembly and packaging of these novel devices has become increasingly critical. MIT Lincoln Laboratory has put significant effort into the screening, reliability testing, and packaging of these components. To provide rapid test and measurement of the APD devices under development, several custom parallel measurement and Geiger-mode (Gm) aging systems have been developed. Another challenge is the accurate attachment of the microlens arrays with the APD arrays to maximize the photon detection efficiency. We have developed an active alignment process with single µm precision in all six degrees of freespace alignment. This is suitable for the alignment of arrays with active areas as small as 5 µm. Finally, we will discuss a focal plane array (FPA) packaging qualification effort, to verify that single photon counting FPAs can survive in future airborne systems.
MIT Department
Lincoln Laboratory
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
http://dx.doi.org/10.1117/12.821294
