Simulation of X-ray phase imaging on integrated circuits
Name
1035390437-MIT.pdf
Description
Full printable version
Size
1.12 MB
Format
Adobe PDF
Checksum (MD5)
de603c9fd111d5516bd63933f8101ef8
Author(s)
Arthur, Kwabena (Kwabena K.)
Advisor(s)
George Barbastathis.
Date Issued
2017
Publisher
Massachusetts Institute of Technology
Abstract
A study on the simulation of the X-Ray phase imaging on multi-layered integrated circuits (IC) is presented. Model IC's were created with random nanoscale features. First order Rytov approximation was then used in order to accurately and rapidly create diffraction images. This study lays the foundation for future use as a forward model in limited-angle tomography or other inverse problems approaches (e.g neural networks) to reconstruct IC layout from x-ray diffraction images. In particular, it is hoped that the simulation presented here can be used to train neural networks that will carry out the inverse problem in experimental situations. The results of the study show that the first Rytov method is promising for use in this application of IC reconstruction.
Description
Thesis: S.B., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2017.
DISCLAIMER NOTICE: The pagination in this thesis reflects how it was delivered to the Institute Archives and Special Collections. Massachusetts Institute of Technology. The images contained in this document are of the best quality available. Cataloged from PDF version of thesis.
Includes bibliographical references (page 12).
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
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