Custom built atomic force microscope for nitrogen-vacancy diamond magnetometry
Name
771939029-MIT.pdf
Description
Full printable version
Size
4.09 MB
Format
Adobe PDF
Checksum (MD5)
26e10c8651112629092d811d45eaef8f
Author(s)
Chang, Kevin Kai
Advisor(s)
Christian L. Degen.
Date Issued
2011
Publisher
Massachusetts Institute of Technology
Abstract
The nitrogen-vacancy (N-V) center in diamonds have the potential to be an ultra-sensitive magnetic field sensor that is capable of detecting single spins. Implementing this sensor for general and nontransparent samples is not trivial. For N-V centers to be a useful probe, a way of positioning the NV center with nanometer accuracy while simultaneously measuring its fluorescence is needed. Here, a method of using N-V centers as magnetometer probes by combining this sensor with Atomic Force Microscopy (AFM) is described. A custom AFM was built that allows optical monitoring of the cantilever tip and collection of fluorescence with a high-NA objective from the same side. The AFM has a large open bottom and top and thus provides dual optical access. The motion of the cantilever is measured by optical beam deflection so that a wide range of commercial cantilevers can be used. The AFM and the confocal microscope objective can be locked in position while a piezoelectric stage allows raster scanning of the substrate.
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Chemistry, 2011.
Cataloged from PDF version of thesis.
Includes bibliographical references (p. 27).
Subjects
Chemistry.
MIT Department
Massachusetts Institute of Technology. Department of Chemistry
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reproduction or distribution in any format is prohibited without written
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