Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC
Name
NSREC2017 - REDW Final Paper - SEE and TID Assessment of Coherent DSP ASIC.pdf
Description
Accepted version
Size
1.29 MB
Format
Unknown
Checksum (MD5)
afa619d9a2f86c9780ddfa7304e8b032
Author(s)
Aniceto, Raichelle
Moro, Slaven
Milanowski, Randall
Isabelle, Christopher
Hall, Norman
Vermeire, Bert
Cahoy, Kerri
Date Issued
July 2017
Journal
2017 IEEE Radiation Effects Data Workshop (REDW)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Aniceto, Raichelle, Moro, Slaven, Milanowski, Randall, Isabelle, Christopher, Hall, Norman et al. 2017. "Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC."
Version
Author's final manuscript
Abstract
© 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si).
MIT Department
Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1109/nsrec.2017.8115466
