Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact
Name
3af53426a9384fc3747716d301cbf4e378df.pdf
Description
Published version
Size
696.26 KB
Format
Unknown
Checksum (MD5)
22cfc88b8507324995f70ec466cb5221
Author(s)
Laine, Hannu S.
Vahlman, Henri
Haarahiltunen, Antti
Jensen, Mallory Ann
Modanese, Chiara
Wagner, Matthias
Wolny, Franziska
Buonassisi, Anthony
Savin, Hele
Date Issued
March 2018
Journal
SiliconPV 2018, The 8th International Conference on Crystalline Silicon Photovoltaics
Publisher
Author(s)
Citation
Laine, Hannu S., Vahlman, Henri, Haarahiltunen, Antti, Jensen, Mallory A., Modanese, Chiara et al. 2018. "Vertically integrated modeling of light-induced defects: Process modeling, degradation kinetics and device impact." 1999.
Version
Final published version
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1063/1.5049255
