Measurement and modeling of small-geometry MOS transistor capacitances
Name
12487529-MIT.pdf
Description
Full printable version
Size
12.65 MB
Format
Adobe PDF
Checksum (MD5)
cdb703a5ac6f2502da37126e3dfde5d1
Author(s)
Paulos, John James
Advisor(s)
Dimitri A. Antoniadis.
Date Issued
1984
Publisher
Massachusetts Institute of Technology
Description
Thesis (Ph.D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1984.
MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING.
Includes bibliographical references.
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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