12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January (IAP) 2006
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12-141January--IAP--2006/OcwWeb/Earth--Atmospheric--and-Planetary-Sciences/12-141January--IAP--2006/CourseHome/index.htm
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Author(s) •
Chatterjee, Nilanjan
Grove, Timothy L.
Alternative Title
Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry
Date Issued
January 2006
Abstract
Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe. From the course home page: Course Description This lab-oriented course introduces the student to the subject of X-ray spectrometry and micro-scale chemical quantitative analysis of solid samples through an intensive series of hands-on laboratory exercises that use the electron microprobe.
Subjects
x-ray microanalysis
electron microprobe
ZAF matrix corrections
wavelength and energy dispersive spectrometry
scanning backscattered electron
secondary electron
cathodoluminescence
and X-ray imaging
MIT Department
Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences
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