Testing of a first-generation dynamically programmable gate array
Name
35561969-MIT.pdf
Description
Full printable version
Size
6.99 MB
Format
Adobe PDF
Checksum (MD5)
ee50c609c6b2d592609a965bbcc22734
Author(s)
Tau, Edward F. (Edward Feiward)
Advisor(s)
Thomas F. Knight, Jr.
Date Issued
1996
Publisher
Massachusetts Institute of Technology
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
Includes bibliographical references (p. 57-58).
Subjects
Electrical Engineering and Computer Science
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.
Persistent DSpace Link
