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Electronic Properties of Intrinsic Defects in Amorphous Silicon Dioxide

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Author(s)
Kastner, Marc A.
Date Issued
January 1981
Publisher
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Series/Report no.
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 123
Description
Contains report on one research project.
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Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.
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