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The application of Moire interferometry to automated 3-dimensional inspection

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Author(s)
Wander, Joseph M
Advisor(s)
Steven Dubowsky.
Date Issued
1985
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1985.
MICROFICHE COPY AVAILABLE IN ARCHIVES AND ENGINEERING.
Includes bibliographical references.
Subjects
Mechanical Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
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