Design, development and characterization of an integrated multispectral polarimetric sensor system
Name
49201442-MIT.pdf
Description
Full printable version
Size
7.94 MB
Format
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Checksum (MD5)
64e4f1d126d7c43f3a4ae5383a103e7c
Author(s)
Kim, Dong-Hyun C. (Dong-Hyun Charles), 1969-
Advisor(s)
Cardinal Warde.
Alternative Title
Integrated multispectral polarimetric sensor system
Date Issued
2001
Publisher
Massachusetts Institute of Technology
Abstract
In this thesis, a new type of integrated imaging sensor is introduced to detect multispectral and polarimetric signatures in an infrared scene. The sensor is a stack consisting of an infrared detector array, and an array of multispectral and polarimetric filters. In this first phase of the research, a single-pixel sensor was built. Multispectral filters were initially fabricated for the 3-5 micron waveband on sapphire substrates and polarimetric filters on silicon substrates. These were characterized separately and in mechanical contact as a single unit. The transmission characteristics of both filters show excellent agreement with the theoretical results. When the filters are integrated into an imaging sensor, such a sensor is anticipated to improve image contrast with sensor-fusion post processing. In addition, it will offer portability and robustness because of its integrated nature.
Description
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.
Includes bibliographical references (p. 115-121).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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