Application of stastical quality control to improve yields and rationalize testing in a low volume manufacturing facility
Name
48863040-MIT.pdf
Description
Full printable version
Size
5.74 MB
Format
Adobe PDF
Checksum (MD5)
abda4a7c798a6d2242c05501536ca206
Author(s)
Knudsen, David Charles, 1972-
Advisor(s)
Roy Welsch and Kevin Amaratunga.
Date Issued
2001
Publisher
Massachusetts Institute of Technology
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 2001.
Includes bibliographical references (p. 71).
Subjects
Sloan School of Management.
Civil and Environmental Engineering.
MIT Department
Massachusetts Institute of Technology. Department of Civil and Environmental Engineering
Sloan School of Management
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