Silica: ubiquitous poison of metal oxide interfaces
Name
d1ta08469k.pdf
Description
Published version
Size
1.5 MB
Format
Adobe PDF
Checksum (MD5)
e4bafc4935e9fe4137afc471f6ce147e
Author(s)
Staerz, Anna
Seo, Han Gil
Defferriere, Thomas
Tuller, Harry L
Date Issued
February 8, 2022
Journal
Journal of Materials Chemistry A
Publisher
Royal Society of Chemistry (RSC)
Citation
Staerz, Anna, Seo, Han Gil, Defferriere, Thomas and Tuller, Harry L. 2022. "Silica: ubiquitous poison of metal oxide interfaces." Journal of Materials Chemistry A, 10 (6).
Abstract
In this review, we consider the detrimental effects of Si-contamination on electrochemical applications, broadly conceived, in which both ions and electrons play key roles in device operation and where exchange of oxygen between the gas and solid phase is likewise essential for operation.
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
Creative Commons Attribution NonCommercial License 3.0
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1039/d1ta08469k
