Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths
Name
Minnich-2011-Letters-Thermal Conductivity Spectroscopy Technique.pdf
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235.77 KB
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Author(s)
Schmidt, A. J.
Minnich, Austin Jerome
Johnson, Jeremiah A.
Esfarjani, Keivan
Dresselhaus, Mildred
Nelson, Keith Adam
Chen, Gang
Date Issued
August 2011
Journal
Physical Review Letters
Publisher
American Physical Society (APS)
Citation
Minnich, A. et al. “Thermal Conductivity Spectroscopy Technique to Measure Phonon Mean Free Paths.” Physical Review Letters 107.9 (2011): n. pag. Web. 27 Jan. 2012. © 2011 American Physical Society
Version
Final published version
Abstract
Size effects in heat conduction, which occur when phonon mean free paths (MFPs) are comparable to characteristic lengths, are being extensively explored in many nanoscale systems for energy applications. Knowledge of MFPs is essential to understanding size effects, yet MFPs are largely unknown for most materials. Here, we introduce the first experimental technique which can measure MFP distributions over a wide range of length scales and materials. Using this technique, we measure the MFP distribution of silicon for the first time and obtain good agreement with first-principles calculations.
MIT Department
Massachusetts Institute of Technology. Department of Chemistry
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Department of Mechanical Engineering
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
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DOI of Published Version
https://doi.org/10.1103/PhysRevLett.107.095901
