Toward Controlling Filament Size and Location for Resistive Switches via Nanoparticle Exsolution at Oxide Interfaces
Name
10.1002-smll.202003224.pdf
Size
1.33 MB
Format
Adobe PDF
Checksum (MD5)
2711a917562ea39b3d94e92a4f446966
Author(s)
Spring, Jonathan
Sediva, Eva
Hood, Zachary D.
Gonzalez‐Rosillo, Juan Carlos
O'Leary, Willis
Kim, Kun Joong
Carrillo, Alfonso J.
Rupp, Jennifer L. M.
Date Issued
September 17, 2020
Journal
Small
Publisher
Wiley
Citation
Spring, Jonathan, Sediva, Eva, Hood, Zachary D., Gonzalez‐Rosillo, Juan Carlos, O'Leary, Willis et al. 2020. "Toward Controlling Filament Size and Location for Resistive Switches via Nanoparticle Exsolution at Oxide Interfaces." Small, 16 (41).
Version
Author's final manuscript
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1002/smll.202003224
