EUV detection of high-frequency surface acoustic waves
Name
Siemens-2009-EUV detection of high-frequency surface acoustic waves.pdf
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572.64 KB
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Author(s)
Siemens, Mark
Li, Qing
Murname, Margaret M.
Kapteyn, Henry C.
Yang, Ronggui
Anderson, Erik
Nelson, Keith Adam
Date Issued
August 2009
Journal
Conference on Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum Electronics and Laser Science Conference. CLEO/QELS 2009.
Publisher
Institute of Electrical and Electronics Engineers
Citation
Siemens, Mark, et al. “EUV detection of high-frequency surface acoustic waves.” Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on. 2009. 1-2. ©2009 IEEE.
Version
Final published version
Abstract
We use coherent extreme ultraviolet radiation to probe surface acoustic wave propagation in nickel-on-sapphire nanostructures. We observe no acoustic dispersion over SAW wavelengths down to 200 nm, meaning the SAW propagation is unaffected by the nanostructure.
MIT Department
Massachusetts Institute of Technology. Department of Chemistry
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