Enhanced solid-state multispin metrology using dynamical decoupling
Name
Pham-2012-Enhanced solid-state multispin metrology using dynamical decoupling.pdf
Size
568.2 KB
Format
Adobe PDF
Checksum (MD5)
caa8d119871a85353a474e8370109db1
Author(s) • • • • • • •
Cappellaro, Paola
Pham, L. M.
Bar-Gill, N.
Belthangady, C.
Sage, D. Le
Lukin, M. D.
Yacoby, A.
Walsworth, R. L.
Date Issued
July 2012
Journal
Physical Review B
Publisher
American Physical Society
Citation
Pham, L. et al. “Enhanced Solid-state Multispin Metrology Using Dynamical Decoupling.” Physical Review B 86.4 (2012). ©2012 American Physical Society
Version
Final published version
Abstract
We use multipulse dynamical decoupling to increase the coherence lifetime (T[subscript 2]) of large numbers of nitrogen-vacancy (NV) electronic spins in room temperature diamond, thus enabling scalable applications of multispin quantum information processing and metrology. We realize an order-of-magnitude extension of the NV multispin T[subscript 2] in three diamond samples with widely differing spin impurity environments. In particular, for samples with nitrogen impurity concentration ≲1 ppm, we extend T[subscript 2] to >2 ms, comparable to the longest coherence time reported for single NV centers, and demonstrate a tenfold enhancement in NV multispin sensing of ac magnetic fields.
MIT Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1103/PhysRevB.86.045214