Advances in quantum metrology
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Lloyd_Advances in quantum.pdf
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285.35 KB
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Adobe PDF
Checksum (MD5)
72b50f62abdbe7cf6f05a9904d7165e7
Author(s)
Giovannetti, Vittorio
Lloyd, Seth
Maccone, Lorenzo
Date Issued
March 2011
Journal
Nature Photonics
Publisher
Nature Publishing Group
Citation
Giovannetti, Vittorio, Seth Lloyd, and Lorenzo Maccone. Advances in Quantum Metrology. Nature Photonics 5, no. 4 (April 2011): 222-229.
Version
Author's final manuscript
Abstract
The statistical error in any estimation can be reduced by repeating the measurement and averaging the results. The central limit theorem implies that the reduction is proportional to the square root of the number of repetitions. Quantum metrology is the use of quantum techniques such as entanglement to yield higher statistical precision than purely classical approaches. In this Review, we analyse some of the most promising recent developments of this research field and point out some of the new experiments. We then look at one of the major new trends of the field: analyses of the effects of noise and experimental imperfections.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Research Laboratory of Electronics
Terms of Use
Creative Commons Attribution-Noncommercial-Share Alike 3.0
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DOI of Published Version
https://doi.org/10.1038/nphoton.2011.35
