Non-destructive electron microscopy through interaction-free quantum measurement
Name
518081060-MIT.pdf
Description
Full printable version
Size
22.56 MB
Format
Adobe PDF
Checksum (MD5)
835a77ab637a42e898e17938c0b807c3
Author(s)
Putnam, William P
Advisor(s)
Mehmet Fatih Yanik.
Date Issued
2008
Publisher
Massachusetts Institute of Technology
Abstract
In this thesis, the possibility of interaction-free quantum measurements with electrons is investigated. With a scheme based on existing charged particle trapping techniques, it is demonstrated that such interaction-free measurements are possible in the presence of previously measured quantum decoherence rates, and the efficiency of the measurement scheme and the absorption probability are estimated. Use of such interaction-free measurements with electrons in imaging applications could dramatically reduce sample damage induced by electron-exposure, which might allow non-destructive, molecular-resolution electron microscopy.
Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008.
Includes bibliographical references (p. 55-57).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
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copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
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