A next-generation in-situ nanoprobe beamline for the Advanced Photon Source
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Buonassisi_A next-generation.pdf
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Author(s)
Maser, Jorg
Lai, Barry
Buonassisi, Tonio
Cai, Zhonghou
Chen, Si
Finney, Lydia
Gleber, Sophie-Charlotte
Harder, Ross
Jacobsen, Chris
Liu, Wenjun
Date Issued
September 2013
Journal
Proceedings of SPIE--the International Society for Optical Engineering
Publisher
SPIE
Citation
Maser, Jorg, Barry Lai, Tonio Buonassisi, Zhonghou Cai, Si Chen, Lydia Finney, Sophie-Charlotte Gleber, et al. “A Next-Generation in-Situ Nanoprobe Beamline for the Advanced Photon Source.” Edited by Barry Lai. X-Ray Nanoimaging: Instruments and Methods (September 26, 2013). © 2013 Society of Photo-Optical Instrumentation Engineers (SPIE)
Version
Final published version
Abstract
The Advanced Photon Source is currently developing a suite of new hard x-ray beamlines, aimed primarily at the study of materials and devices under real conditions. One of the flagship beamlines of the APS Upgrade is the In-Situ Nanoprobe beamline (ISN beamline), which will provide in-situ and operando characterization of advanced energy materials and devices under change of temperature and gases, under applied fields, in 3D. The ISN beamline is designed to deliver spatially coherent x-rays with photon energies between 4 keV and 30 keV to the ISN instrument. As an x-ray source, a revolver-type undulator with two interchangeable magnetic structures, optimized to provide high brilliance throughout the range of photon energies of 4 keV – 30 keV, will be used. The ISN instrument will provide a smallest hard x-ray spot of 20 nm using diffractive optics, with sensitivity to sub-10 nm sample structures using coherent diffraction. Using nanofocusing mirrors in Kirkpatrick-Baez geometry, the ISN will also provide a focus of 50 nm with a flux of 8·1011 Photons/s at a photon energy of 10 keV, several orders of magnitude larger than what is currently available. This will allow imaging of trace amounts of most elements in the periodic table, with a sensitivity to well below 100 atoms for most metals in thin samples. It will also enable nanospectroscopic studies of the chemical state of most materials relevant to energy science. The ISN beamline will be primarily used to study inorganic and organic photovoltaic systems, advanced batteries and fuel cells, nanoelectronics devices, and materials and systems diesigned to reduce the environmental impact of combustion.
MIT Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
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DOI of Published Version
https://doi.org/10.1117/12.2026418
