A Frequency-domain Approach to Noninvasive Intracranial Pressure Estimation
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Jaishankar_Rohan_EMBC2019_submitted.pdf
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Author(s)
Jaishankar, Rohan
Fanelli, Andrea
Filippidis, Aristotelis
Vu, Thai
Holsapple, James
Heldt, Thomas
Date Issued
October 2019
Journal
41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Jaishankar, Rohan et al. "A Frequency-domain Approach to Noninvasive Intracranial Pressure Estimation." 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (October 2019): dx.doi.org/10.1109/embc.2019.8857042. © 2019 IEEE
Version
Author's final manuscript
Abstract
Intracranial pressure (ICP) is a cranial vital sign, crucial in the monitoring and treatment of several neurological injuries. The clinically accepted measurement modalities of ICP are highly invasive, carrying risks of infection and limiting the benefits of ICP measurement to a small subset of critically ill patients. This work aims to take a step towards developing an accurate noninvasive means of estimating ICP, by utilizing a model-based frequency-domain approach. The mean ICP and pulse pressures of ICP are estimated from arterial blood pressure (ABP) and cerebral blood flow velocity (CBFV) waveforms, and the estimates are validated on an adult population, comprising of around two hours of data from five patients. The algorithm was shown to have an accuracy (mean error) of -1.5 mmHg and a precision (standard deviation of the error) of 4.3 mmHg in estimating the mean ICP. These results are comparable to the previously reported errors among the currently accepted invasive measurement methods, and well within the clinically relevant range.
MIT Department
Massachusetts Institute of Technology. Institute for Medical Engineering & Science
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Creative Commons Attribution-Noncommercial-Share Alike
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DOI of Published Version
https://doi.org/10.1109/embc.2019.8857042
