Sequential screening in semiconductor manufacturing.
Name
SWP-3452-26776378.pdf
Size
3.14 MB
Format
Adobe PDF
Checksum (MD5)
1a9aa9e2a4c688c6e1e585f68ec0c6ae
Author(s) • •
Longtin, Mark D.
Wein, Lawrence M.
Welsch, Roy E.
Date Issued
April 29, 2003
Publisher
Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992.
Series/Report no.
Working paper (Sloan School of Management) ; 3452-92.
Description
Includes bibliographical references (p. 41-42).
MIT Department
Massachusetts Institute of Technology. Operations Research Center
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