Sequential screening in semiconductor manufacturing.

Name

SWP-3452-26776378.pdf

Size

3.14 MB

Format

Adobe PDF

Checksum (MD5)

1a9aa9e2a4c688c6e1e585f68ec0c6ae

Author(s)

Longtin, Mark D.

•

Wein, Lawrence M.

•

Welsch, Roy E.

Date Issued

April 29, 2003

Publisher

Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992.

Series/Report no.

Working paper (Sloan School of Management) ; 3452-92.

Description

Includes bibliographical references (p. 41-42).

MIT Department

Massachusetts Institute of Technology. Operations Research Center

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