Curvature-Controlled Defect Localization in Elastic Surface Crystals
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PhysRevLett.116.104301.pdf
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Author(s)
Stoop, Norbert
Lagrange, Romain
Lopez Jimenez, Francisco
Dunkel, Joern
Reis, Pedro Miguel
Date Issued
March 2016
Journal
Physical Review Letters
Publisher
American Physical Society
Citation
Jimenez, Francisco Lopez, Norbert Stoop, Romain Lagrange, Jorn Dunkel, and Pedro M. Reis. “Curvature-Controlled Defect Localization in Elastic Surface Crystals.” Physical Review Letters 116, no. 10 (March 7, 2016). © 2016 American Physical Society
Version
Final published version
Abstract
We investigate the influence of curvature and topology on crystalline dimpled patterns on the surface of generic elastic bilayers. Our numerical analysis predicts that the total number of defects created by adiabatic compression exhibits universal quadratic scaling for spherical, ellipsoidal, and toroidal surfaces over a wide range of system sizes. However, both the localization of individual defects and the orientation of defect chains depend strongly on the local Gaussian curvature and its gradients across a surface. Our results imply that curvature and topology can be utilized to pattern defects in elastic materials, thus promising improved control over hierarchical bending, buckling, or folding processes. Generally, this study suggests that bilayer systems provide an inexpensive yet valuable experimental test bed for exploring the effects of geometrically induced forces on assemblies of topological charges.
MIT Department
Massachusetts Institute of Technology. Department of Civil and Environmental Engineering
Massachusetts Institute of Technology. Department of Mathematics
Massachusetts Institute of Technology. Department of Mechanical Engineering
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DOI of Published Version
https://doi.org/10.1103/PhysRevLett.116.104301
