Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory
Name
PhysRevMaterials.6.084601.pdf
Description
Published version
Size
2 MB
Format
Adobe PDF
Checksum (MD5)
6a11f2a3cf26a103d987f6fe66c3f6f5
Author(s)
Logan, Julie V
Webster, Preston T
Woller, Kevin B
Morath, Christian P
Short, Michael P
Date Issued
August 8, 2022
Journal
Physical Review Materials
Publisher
American Physical Society (APS)
Citation
Logan, Julie V, Webster, Preston T, Woller, Kevin B, Morath, Christian P and Short, Michael P. 2022. "Understanding the fundamental driver of semiconductor radiation tolerance with experiment and theory." Physical Review Materials, 6 (8).
Version
Final published version
MIT Department
Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Terms of Use
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1103/physrevmaterials.6.084601
