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  5. The correspondence of dislocation etch pits revealed on (111) and (100) surfaces of germanium grown in the <100> direction.

The correspondence of dislocation etch pits revealed on (111) and (100) surfaces of germanium grown in the <100> direction.

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Author(s)
Boylan, John Francis.
Advisor(s)
August F. Witt.
Date Issued
1975
Publisher
Massachusetts Institute of Technology
Description
Thesis: B.S., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 1975
Includes bibliographical references.
Subjects
Materials Science and Engineering
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
Terms of Use
MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.
http://dspace.mit.edu/handle/1721.1/7582
Persistent DSpace Link
https://hdl.handle.net/1721.1/140446
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