The correspondence of dislocation etch pits revealed on (111) and (100) surfaces of germanium grown in the <100> direction.
Name
02193257-MIT.pdf
Size
13.42 MB
Format
Adobe PDF
Checksum (MD5)
27903c214325cbb64aa76d4fd35713d8
Author(s)
Boylan, John Francis.
Advisor(s)
August F. Witt.
Date Issued
1975
Publisher
Massachusetts Institute of Technology
Description
Thesis: B.S., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 1975
Includes bibliographical references.
Subjects
Materials Science and Engineering
MIT Department
Massachusetts Institute of Technology. Department of Materials Science and Engineering
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