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  4. Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation

Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation

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Author(s)
Beyler, Andrew P.
•
Bischof, Thomas Stanley
•
Cui, Jian
•
Coropceanu, Igor
•
Harris, Daniel Kelly
•
Bawendi, Moungi G
Date Issued
November 2014
Journal
Nano Letters
Publisher
American Chemical Society (ACS)
Citation
Beyler, Andrew P.; Bischof, Thomas S.; Cui, Jian; Coropceanu, Igor; Harris, Daniel K. and Bawendi, Moungi G. “Sample-Averaged Biexciton Quantum Yield Measured by Solution-Phase Photon Correlation.” Nano Letters 14, 12 (December 2014): 6792–6798 © 2014 American Chemical Society
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Author's final manuscript
Abstract
The brightness of nanoscale optical materials such as semiconductor nanocrystals is currently limited in high excitation flux applications by inefficient multiexciton fluorescence. We have devised a solution-phase photon correlation measurement that can conveniently and reliably measure the average biexciton-to-exciton quantum yield ratio of an entire sample without user selection bias. This technique can be used to investigate the multiexciton recombination dynamics of a broad scope of synthetically underdeveloped materials, including those with low exciton quantum yields and poor fluorescence stability. Here, we have applied this method to measure weak biexciton fluorescence in samples of visible-emitting InP/ZnS and InAs/ZnS core/shell nanocrystals, and to demonstrate that a rapid CdS shell growth procedure can markedly increase the biexciton fluorescence of CdSe nanocrystals.
MIT Department
Massachusetts Institute of Technology. Department of Chemistry
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Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.
Persistent DSpace Link
http://hdl.handle.net/1721.1/110437
DOI of Published Version
https://doi.org/10.1021/nl5027953
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