Exploiting cross-channel quantizer error correlation in time-interleaved analog-to-digital converters
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AsilomarFinal_McMichael_Maymon_Oppenheim.pdf
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2.29 MB
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Author(s)
McMichael, Joseph G.
Maymon, Shay
Oppenheim, Alan V.
Date Issued
November 2011
Journal
Proceedings of the 2011 Conference Record of the Forty Fifth Asilomar Conference on Signals, Systems and Computers (ASILOMAR)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
McMichael, Joseph G., Shay Maymon, and Alan V. Oppenheim. Exploiting Cross-channel Quantizer Error Correlation in Time-interleaved Analog-to-digital Converters. In 2011 Conference Record of the Forty Fifth Asilomar Conference on Signals, Systems and Computers (ASILOMAR), 525-529. Institute of Electrical and Electronics Engineers, 2011.
Version
Author's final manuscript
Abstract
Uniform quantizers are often modeled as additive uncorrelated noise sources. This paper explores the validity of the additive noise model in the environment of time-interleaved A/D converters. Cross-channel quantizer error correlation is an important discrepancy that arises for channel time delays in close proximity. It is demonstrated through simulation that negative error correlation occurs for different granularity quantizers in close proximity. Statistical analysis is presented to characterize error correlation between quantizers with different granularity. A technique exploiting this correlation often yields significant performance gains above the optimal additive noise model solution.
MIT Department
Massachusetts Institute of Technology. Digital Signal Processing Group
Lincoln Laboratory
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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Creative Commons Attribution-Noncommercial-Share Alike 3.0
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DOI of Published Version
https://doi.org/10.1109/ACSSC.2011.6190056
